ISPLSI2128VL-100LQ160 查看數據表（PDF） - Lattice Semiconductor

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ISPLSI2128VL-100LQ160

2.5V In-System Programmable SuperFAST™ High Density PLD

Lattice Semiconductor 

Specifications ispLSI 2128VL

Absolute Maximum Ratings 1

Supply Voltage Vcc ................................ -0.5 to +4.05V

Input Voltage Applied ............................. -0.5 to +4.05V

Off-State Output Voltage Applied .......... -0.5 to +4.05V

Storage Temperature ................................ -65 to 150°C

Case Temp. with Power Applied .............. -55 to 125°C

Max. Junction Temp. (TJ) with Power Applied ... 150°C

1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional

operation of the device at these or at any other conditions above those indicated in the operational sections of this specification

is not implied (while programming, follow the programming specifications).

DC Recommended Operating Condition

SYMBOL

VCC

VIL

VIH

Supply Voltage

Input Low Voltage

Input High Voltage

PARAMETER

Commercial TA = 0°C to + 70°C

Industrial

TA = -40°C to + 85°C

MIN.

2.3

2.3

-0.3

1.7

MAX. UNITS

2.7

V

2.7

V

0.7

V

3.6

V

Table 2-0005/2128VL

Capacitance (TA=25°C, f=1.0 MHz)

SYMBOL

C1

C2

C3

PARAMETER

Dedicated Input Capacitance

I/O Capacitance

Clock and Global Output Enable Capacitance

TYPICAL

8

6

10

UNITS

pf

pf

pf

TEST CONDITIONS

VCC = 2.5V, VIN = 0.0V

VCC = 2.5V, VI/O = 0.0V

VCC = 2.5V, VY = 0.0V

Table 2-0006/2128VL

Erase Reprogram Specifications

PARAMETER

Erase/Reprogram Cycles

MINIMUM

10,000

MAXIMUM

–

UNITS

Cycles

Table 2-0008/2128VL

3

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