74HCT00DB(2010) 查看數據表（PDF） - NXP Semiconductors.
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74HCT00DB Datasheet PDF : 15 Pages
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NXP Semiconductors
74HC00; 74HCT00
Quad 2-input NAND gate
VI 90 %
tW
negative
pulse
VM
GND
10 %
tf
tr
VI
90 %
positive
pulse
VM
10 %
GND
tW
VCC
VI
G
DUT
RT
VM
tr
tf
VM
VO
CL
001aah768
Fig 7.
Test data is given in Table 9.
Definitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Load circuitry for measuring switching times
Table 9. Test data
Type
74HC00
74HCT00
Input
VI
VCC
3.0 V
tr, tf
6.0 ns
6.0 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
Test
tPLH, tPHL
tPLH, tPHL
74HC_HCT00_4
Product data sheet
Rev. 04 — 11 January 2010
© NXP B.V. 2010. All rights reserved.
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