28C256TRT1DB12 查看數據表（PDF） - MAXWELL TECHNOLOGIES
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28C256TRT1DB12 Datasheet PDF : 14 Pages
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28C256T
256K EEPROM (32K x 8-Bit)
EEPROM
VCC
GND
OE
WE
CE
ADDRESS
INPUTS
DATA INPUTS/OUTPUT
I/O0 - I/O7
OE, CE, and WE
LOGIC
Y DECODER
X DECODER
Logic Diagram
DATA LATCH
INPUT/OUTPUT
BUFFERS
Y-GATING
CELL MATRIX
IDENTIFICATION
FEATURES:
• RAD-PAK® radiation-hardened against natural space radia-
tion
• Total dose hardness:
- > 100 Krad (Si), dependent upon space mission
• Excellent Single Event Effects:
- SELTH LET: > 120 MeV/mg/cm2
- SEUTH LET (read mode): > 90 MeV/mg/cm2
- SEUTH LET (write mode): > 18 MeV/mg/cm2
• Package:
- 28 pin RAD-PAK® flat pack
- 28 pin RAD-PAK® DIP
- JEDEC approved byte wide pinout
• High Speed:
- 120, 150 ns maximum access times available
• High endurance:
- 10,000 erase/write (in Page Mode), 10-year data
retention
• Page Write Mode:
- 1 to 64 bytes
• Low power dissipation:
- 15 mA active current (cycle = 1 µs)
- 20 µA standby current (CE = VCC)
DESCRIPTION:
Maxwell Technologies’ 28C256T high density 256k-bit
EEPROM microcircuit features a greater than 100 krad (Si)
total dose tolerance, depending upon space mission. The
28C256T is capable of in-system electrical byte and page pro-
grammability. It has a 64-Byte page programming function to
make its erase and write operations faster. It also features
data polling to indicate the completion of erase and program-
ming operations.
Maxwell Technologies' patented RAD-PAK® packaging technol-
ogy incorporates radiation shielding in the microcircuit pack-
age. It eliminates the need for box shielding while providing
the required radiation shielding for a lifetime in orbit or space
mission. In a GEO orbit, RAD-PAK provides greater than 100
krad (Si) radiation dose tolerance. This product is available
with screening up to Class S.
1000584
12.19.01 Rev 5
(858) 503-3300 - Fax: (858) 503-3301- www.maxwell.com
All data sheets are subject to change without notice 1
©2001 Maxwell Technologies
All rights reserved.
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