3D7701-0.4 查看數據表（PDF） - Data Delay Devices
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3D7701-0.4 Datasheet PDF : 4 Pages
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3D7701
SILICON DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
Ambient Temperature: 25oC ± 3oC
Supply Voltage (Vcc): 5.0V ± 0.1V
Input Pulse:
High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
Source Impedance: 50Ω Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6V and 2.4V )
OUTPUT:
Rload:
Cload:
Threshold:
10KΩ ± 10%
5pf ± 10%
1.5V (Rising & Falling)
Device
Under
Test
10KΩ
470Ω
Digital
Scope
5pf
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
COMPUTER
SYSTEM
PRINTER
PULSE
OUT
GENERATOR
TRIG
O1
EN DEVICE UNDER
TEST (DUT) O2
REF
IN
FREQUENCY/
TIME INTERVAL COUNTER
TRIG
Figure 3: Test Setup
tFALL
2.4V
EN 1.5V
0.6V
VIL
tENB
1/fOSC
O2
1.5V
1.5V
tRISE
2.4VVIH
1.5V
0.6V
tDIS
1.5V
Figure 4: Timing Diagram
Doc #06023
DATA DELAY DEVICES, INC.
4
12/5/2006
Tel: 973-773-2299 Fax: 973-773-9672 http://www.datadelay.com
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