74ACQ543SPC 查看數據表（PDF） - Fairchild Semiconductor
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74ACQ543SPC Datasheet PDF : 9 Pages
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DC Electrical Characteristics for ACQ (Continued)
Symbol
Parameter
VCC
TA = +25°C
TA = −40°C to +85°C
Units
(V)
Typ
Guaranteed Limits
Conditions
VOLP
VOLV
VIHD
Quiet Output
Maximum Dynamic VOL
Quiet Output
Minimum Dynamic VOL
Minimum HIGH Level
Dynamic Input Voltage
5.0
1.1
1.5
5.0
−0.6
−1.2
5.0
3.1
3.5
Figures 1, 2
V
(Note 5)(Note 6)
Figures 1, 2
V
(Note 5)(Note 6)
V (Note 5)(Note 7)
VILD
Maximum LOW Level
Dynamic Input Voltage
5.0
1.9
1.5
V (Note 5)(Note 7)
Note 2: Maximum of 8 outputs loaded; thresholds on input associated with output under test.
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.
Note 4: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC.
Note 5: Plastic DIP package.
Note 6: Max number of outputs defined as (n). Data Inputs are driven 0V to 5V. One output @ GND.
Note 7: Max number of Data Inputs (n) switching. (n–1) Inputs switching 0V to 5V (ACQ). Input-under-test switching: 5V to threshold (VILD),
0V to threshold (VIHD), f = 1 MHz.
DC Electrical Characteristics for ACTQ
Symbol
Parameter
VCC
TA = +25°C
TA = −40°C to +85°C
Units
(V)
Typ
Guaranteed Limits
Conditions
Minimum HIGH Level
VIH
Input Voltage
Maximum LOW Level
VIL
Input Voltage
Minimum HIGH Level
Output Voltage
4.5
1.5
2.0
2.0
5.5
1.5
2.0
2.0
4.5
1.5
0.8
0.8
5.5
1.5
0.8
0.8
4.5
4.49
4.4
4.4
5.5
5.49
5.4
5.4
V
VOUT = 0.1V
or VCC − 0.1V
V
VOUT = 0.1V
or VCC − 0.1V
V
IOUT = −50 µA
VOH
Maximum LOW Level
Output Voltage
4.5
3.86
3.76
5.5
4.86
4.76
4.5
0.001
0.1
0.1
5.5
0.001
0.1
0.1
VIN = VIL or VIH
V
IOH = −24 mA
IOH = −24 mA (Note 8)
V
IOUT = 50 µA
VOL
IIN
IOZT
ICCT
IOLD
IOHD
ICC
VOLP
VOLV
VIHD
4.5
5.5
Maximum Input Leakage Current
5.5
Maximum I/O
5.5
Leakage Current
Maximum ICC/Input
5.5
Minimum Dynamic
5.5
Output Current (Note 9)
5.5
Maximum Quiescent Supply Current 5.5
Quiet Output
5.0
Maximum Dynamic VOL
Quiet Output
5.0
Minimum Dynamic VOL
Minimum HIGH Level Dynamic
Input Voltage
5.0
0.36
0.36
± 0.1
±0.6
0.6
8.0
1.1
1.5
−0.6
−1.2
1.9
2.2
0.44
0.44
± 1.0
6.0
1.5
75
−75
80.0
VIN = VIL or VIH
V
IOL = 24 mA
IOL = 24 mA (Note 8)
µA VI = VCC, GND
µA
V(OE) = VIL, VIH
VO = VCC, GND
mA VI = VCC − 2.1V
mA VOLD = 1.65V Max
mA VOHD = 3.85V Min
µA VIN = VCC or GND
Figures 1, 2
V
(Note 10)(Note 11)
Figures 1, 2
V
(Note 10)(Note 11)
V (Note 10)(Note 12)
VILD
Maximum LOW Level Dynamic
Input Voltage
5.0
1.2
0.8
V (Note 10)(Note 12)
Note 8: Maximum of 8 outputs loaded; thresholds on input associated with output under test.
Note 9: Maximum test duration 2.0 ms, one output loaded at a time.
Note 10: DIP package
Note 11: Max number of outputs defined as (n). (n−1) Data Inputs are driven 0V to 3V, one output @ GND.
Note 12: Max number of Data Inputs (n) switching. (n–1) Inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to threshold (VILD),
0V to threshold (VIHD), f =1 MHz.
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