AM27C010-90JI 查看數據表（PDF） - Advanced Micro Devices
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AM27C010-90JI Datasheet PDF : 12 Pages
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CAPACITANCE
Parameter Parameter
Test
Symbol Description Conditions
CIN
Input
Capacitance
VIN = 0
COUT
Output
Capacitance
VOUT = 0
CDV032
Typ Max
9
12
13
15
Notes:
1. This parameter is only sampled and not 100% tested.
2. TA = +25°C, f = 1 MHz.
PL 032
Typ Max
8
12
11
14
PD 032
Typ Max
8
12
11
14
TS 032
Typ Max Unit
10
12
pF
12
14
pF
AC CHARACTERISTICS
Parameter
Symbols
JEDEC Standard
Parameter
Description
Test
Conditions
Am27C010
-45 -55 -70 -90 -120 -150 -200 -255 Unit
tAVQV
tELQV
tACC
Address to Output Delay
CE,
OE = VIL
Max
45
55
70
90 120 150 200 250
ns
tCE
Chip Enable to Output
Delay
OE = VIL Max 45 55 70 90 120 150 200 250 ns
tGLQV
tOE
Output Enable to Output
Delay
CE = VIL Max
25
35
35
40
50
65
75
75
ns
tEHQZ
tGHQZ
tDF
(Note 3)
Chip Enable High or
Output Enable High to
Output Float, Whichever
Occurs First
Max 25 25 25 25 35 35 40 40 ns
tAXQX
Output Hold from
tOH Addresses, CE, or OE,
Whichever Occurs First
Min 0 0 0 0 0 0 0 0 ns
Notes:
1. Caution: Do not remove the Am27C010 from (or insert it into) a socket or board that has VPP or VCC applied.
2. VCC must be applied simultaneously or before VPP, and removed simultaneously or after VPP.
3. This parameter is sampled and not 100% tested.
4. Switching characteristics are over operating range, unless otherwise specified.
5. Test Conditions for Am27C010-45 and -55:
Output Load: 1 TTL gate and CL = 30 pF
Input rise and fall times: 20 ns
Input pulse levels: 0.0 V to 3.0 V
Timing measurement reference level Inputs and Outputs: 1.5 V
Test Conditions for all others:
Output Load: 1 TTL gate and CL = 100 pF
Input rise and fall times: 20 ns
Input pulse levels: 0.45 V to 2.4 V
Timing measurement reference level Inputs and Outputs: 0.8 and 2.0 V
10
Am27C010
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