Low-Voltage, 60Ω,
4:1 Analog Multiplexer in QFN
CHANNEL
SELECT
VINH
V+
ADDB
ADDA
V+
NO_
MAX4704
INH
COM
GND
REPEAT TEST FOR EACH SECTION.
Figure 5. Charge Injection
Test Circuits/Timing Diagrams (continued)
VNO = 0
V+
VINH
0
VOUT
CL
1000pF
VOUT
∆ VOUT
∆ VOUT IS THE MEASURED VOLTAGE DUE TO CHARGE-
TRANSFER ERROR Q WHEN THE CHANNEL TURNS OFF.
Q = ∆ VOUT X CL
CHANNEL
SELECT
V+ 10nF
V+
ADDA
NO_
ADDB MAX4704
INH
COM
GND
NETWORK
ANALYZER
VIN
50Ω
50Ω
VOUT
MEAS.
REF.
50Ω 50Ω
VOUT
OFF-ISOLATION = 20log VIN
ON-LOSS = 20log VOUT
VIN
CROSSTALK = 20log VOUT
VIN
MEASUREMENTS ARE STANDARDIZED AGAINST SHORT AT SOCKET TERMINALS.
OFF-ISOLATION IS MEASURED BETWEEN COM AND "OFF" NO TERMINAL ON EACH SWITCH.
ON-LOSS IS MEASURED BETWEEN COM AND "ON" NO TERMINAL ON EACH SWITCH.
CROSSTALK IS MEASURED FROM ONE CHANNEL (A, B) TO OTHER CHANNEL.
SIGNAL DIRECTION THROUGH SWITCH IS REVERSED; WORST VALUES ARE RECORDED.
Figure 6. Off-Isolation, On-Loss, and Crosstalk
V+
CHANNEL
SELECT
V+
ADDA
NO_
ADDB
NO_
MAX4704
Chip Information
TRANSISTOR COUNT: 256
PROCESS: CMOS
INH
COM
GND
1MHz
CAPACITANCE
ANALYZER
Figure 7. NO_/COM Capacitance
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