MAX5018A 查看數據表（PDF） - Maxim Integrated

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MAX5018A

8-Bit, High-Speed DAC

Maxim Integrated 

8-Bit, High-Speed DAC

TEST-LEVEL CODES

All electrical characteristics are subject to

the following conditions:

All parameters having min/max specifica-

tions are guaranteed. The Test Level column

indicates the specific device testing actually

performed during production and Quality

Assurance inspection. Any blank section in

the data column indicates that the specifica-

tion is not tested at the specified condition.

Unless otherwise noted, all tests are pulsed

tests; therefore, Tj = TC = TA.

TEST LEVEL

I

II

III

IV

V

VI

TEST PROCEDURE

100% production tested at the specified temperature.

100% production tested at TA = +25°C, and sample

tested at the specified temperatures.

QA sample tested at only the specified temperatures.

Parameter is guaranteed (but not tested) by design

and characterization data.

Parameter is a typical value for reference only.

100% production tested at TA = +25°C. Parameter is

guaranteed over specified temperature range.

______________________________________________________________Pin Description

PIN

1, 2, 3

4

5, 20

6

7

8

9, 17

10

11

12

13

14

15

16

18

19

21

22, 23, 24

NAME

D3, D2, D1

D0

VEE

CONV

CONV

FT

VCC

FH

Blank

BRT

Sync

Ref-

Ref+

COMP

Out-

Out+

D7

D6, D5, D4

Data Bits 3, 2, and 1

Data Bit 0 (LSB)

Negative Supply

Convert Clock Input

Convert-Clock-Input Complement

Register Feedthrough Control

Positive Supply

Data Force-High Control

Video Blank Input

Video Bright Input

Video Sync Input

Reference Current, Negative Input

Reference Current, Positive Input

Compensation Input

Output Current Negative

Output Current Positive

Data Bit 7 (MSB)

Data Bits 6, 5, and 4

FUNCTION

4 _______________________________________________________________________________________

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