STF3NK80Z 查看數據表（PDF） - STMicroelectronics

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产品描述 (功能)

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STF3NK80Z

N-channel 800 V, 3.8 Ω, 2.5 A, TO-220, TO-220FP, DPAK, IPAK Zener-protected SuperMESH™ Power MOSFET

STMicroelectronics 

Test circuits

3

Test circuits

STD3NK80Z, STD3NK80Z-1, STF3NK80Z, STP3NK80Z

Figure 17. Switching times test circuit for

resistive load

Figure 18. Gate charge test circuit

VDD

VD

VGS

RG

PW

RL

2200

µF

D.U.T.

3.3

µF VDD

12V

47kΩ

1kΩ

100nF

Vi=20V=VGMAX

2200

µF

IG=CONST

2.7kΩ

100Ω

D.U.T.

VG

47kΩ

PW

AM01468v1

1kΩ

AM01469v1

Figure 19. Test circuit for inductive load

Figure 20. Unclamped inductive load test

switching and diode recovery times

circuit

G

25 Ω

A

D

D.U.T.

S

B

AA

FAST

DIODE

L=100µH

B

3.3

B

µF

D

G

RG

S

1000

µF

VDD

Vi

L

VD

2200

3.3

µF

µF

VDD

ID

D.U.T.

Pw

AM01470v1

AM01471v1

Figure 21. Unclamped inductive waveform Figure 22. Switching time waveform

V(BR)DSS

VD

ton

tdon

tr

toff

tdoff tf

VDD

IDM

ID

0

VDD

90%

10% VDS

90%

VGS

90%

10%

AM01472v1

0

10%

AM01473v1

10/18

Doc ID 9565 Rev 6

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