DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

DSP56F805 查看數據表(PDF) - Freescale Semiconductor

零件编号
产品描述 (功能)
生产厂家
DSP56F805
Freescale
Freescale Semiconductor Freescale
DSP56F805 Datasheet PDF : 56 Pages
First Prev 11 12 13 14 15 16 17 18 19 20 Next Last
2.14 JTAG/OnCE
JTAG/OnCE
Table 2-18 JTAG/On-Chip Emulation (OnCE) Signals
No. of Signal Signal State During
Pins Name Type
Reset
Signal Description
1
TCK Input Input, pulled Test Clock Input—This input pin provides a gated clock to
(Schmitt) low internally synchronize the test logic and shift serial data to the JTAG/OnCE
port. The pin is connected internally to a pull-down resistor.
1
TMS Input Input, pulled Test Mode Select Input—This input pin is used to sequence the
(Schmitt) high internally JTAG TAP controller’s state machine. It is sampled on the rising
edge of TCK and has an on-chip pull-up resistor.
Note: Always tie the TMS pin to VDD through a 2.2K resistor.
1
TDI
Input Input, pulled Test Data Input—This input pin provides a serial input data stream
(Schmitt) high internally to the JTAG/OnCE port. It is sampled on the rising edge of TCK and
has an on-chip pull-up resistor.
1
TDO Output Tri-stated Test Data Output—This tri-statable output pin provides a serial
output data stream from the JTAG/OnCE port. It is driven in the
Shift-IR and Shift-DR controller states, and changes on the falling
edge of TCK.
1
TRST Input Input, pulled Test Reset—As an input, a low signal on this pin provides a reset
(Schmitt) high internally signal to the JTAG TAP controller. To ensure complete hardware
reset, TRST should be asserted at power-up and whenever RESET
is asserted. The only exception occurs in a debugging environment
when a hardware device reset is required and it is necessary not to
reset the OnCE/JTAG module. In this case, assert RESET, but do
not assert TRST.
Note: For normal operation, connect TRST directly to VSS. If the design
is to be used in a debugging environment, TRST may be tied to VSS
through a 1K resistor.
1
DE Output
Output Debug Event—DE provides a low pulse on recognized debug
events.
Part 3 Specifications
3.1 General Characteristics
The 56F805 is fabricated in high-density CMOS with 5V-tolerant TTL-compatible digital inputs. The term
“5V-tolerant” refers to the capability of an I/O pin, built on a 3.3V-compatible process technology, to
withstand a voltage up to 5.5V without damaging the device. Many systems have a mixture of devices
designed for 3.3V and 5V power supplies. In such systems, a bus may carry both 3.3V and 5V-compatible
I/O voltage levels (a standard 3.3V I/O is designed to receive a maximum voltage of 3.3V ± 10% during
56F805 Technical Data, Rev. 15
Freescale Semiconductor
19

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]