5962R9581801QXC(1996) 查看數據表（PDF） - Intersil

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5962R9581801QXC
(Rev.:1996)

Radiation Hardened 8-Bit Input/Output Port

Intersil 

Specifications HS-82C12RH

TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS

PARAMETER

Input Capacitance

Output Capacitance

Pulse Width

Data Set Up Time

Data Hold Time

SYMBOL

CONDITIONS

GROUP A

SUBGROUPS TEMPERATURE

LIMITS

MIN MAX

UNITS

CIN

VDD = Open, f = 1MHz, All

measurements referenced to

device ground

TA = +25oC

-

8

pF

COUT

VDD = Open, f = 1MHz, All

measurements referenced to

device ground

TA = +25oC

-

8

pF

TPW VDD = 4.75, VIH = 3.75, VIL = 1.0 9, 10, 11

-55oC, +25oC,

-

50

ns

+125oC

TSET VDD = 4.75, VIH = 3.75, VIL = 1.0 9, 10, 11

-55oC, +25oC,

-

30

ns

+125oC

TH

VDD = 4.75, VIH = 3.75, VIL = 1.0 9, 10, 11

-55oC, +25oC,

-

40

ns

+125oC

NOTE: The parameters listed in Table 3 are controlled via design or process parameters and are not directly tested. These parameters are

characterized upon initial design release and upon design changes which would affect these characteristics.

TABLE 4. POST 100K RAD ELECTRICAL PERFORMANCE CHARACTERISTICS

NOTE: The Post Irradiation test conditions and limits are the same as those listed in Table 1 and Table 2.

Spec Number 518063

4

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