74AHC126BQ(2020) 查看數據表（PDF） - NXP Semiconductors.

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74AHC126BQ
(Rev.:2020)

Quad buffer/line driver; 3-state

NXP Semiconductors. 

Nexperia

VI 90 %

tW

negative

pulse

VM

10 %

0V

tf

VI

positive

pulse

tr

90 %

VM

10 %

0V

tW

74AHC126; 74AHCT126

Quad buffer/line driver; 3-state

VM

tr

tf

VM

VI

G

VCC

VO

DUT

RT

VCC

RL S1

CL

open

Fig. 8.

001aad983

Test data is given in Table 9.

Definitions test circuit:

RT = termination resistance should be equal to output impedance Zo of the pulse generator.

CL = load capacitance including jig and probe capacitance.

RL = load resistance.

S1 = test selection switch.

Test circuit for measuring switching times

Table 9. Test data

Type

74AHC126

74AHCT126

Input

VI

VCC

3.0 V

tr, tf

≤ 3.0 ns

≤ 3.0 ns

Load

CL

RL

15 pF, 50 pF 1 kΩ

15 pF, 50 pF 1 kΩ

S1 position

tPHL, tPLH

open

open

tPZH, tPHZ

GND

GND

tPZL, tPLZ

VCC

VCC

74AHC_AHCT126

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 5 — 28 April 2020

© Nexperia B.V. 2020. All rights reserved

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