74AHC574BQ 查看數據表（PDF） - NXP Semiconductors.

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74AHC574BQ

Octal D-type flip-flop; positive edge-trigger; 3-state

NXP Semiconductors. 

74AHC574; 74AHCT574

Octal D-type flip-flop; positive edge-trigger; 3-state

Rev. 02 — 24 January 2008

Product data sheet

1. General description

The 74AHC574; 74AHCT574 are high-speed Si-gate CMOS devices and are pin

compatible with Low Power Schottky TTL (LSTTL). They are specified in compliance with

JEDEC standard no. 7A.

The 74AHC574; 74AHCT574 are octal D-type flip-flops featuring separate D-type inputs

for each flip-flop and 3-state outputs for bus oriented applications. A clock (CP) and an

output enable (OE) input are common to all flip-flops.

The 8 flip-flops will store the state of their individual D-inputs that meet the set-up and hold

times requirements on the LOW-to-HIGH CP transition.

When OE is LOW the contents of the 8 flip-flops are available at the outputs. When OE is

HIGH, the outputs go to the high-impedance OFF-state. Operation of the OE input does

not affect the state of the flip-flops.

The 74AHC574; 74AHCT574 is functionally identical to the 74AHC564; 74AHCT564, but

has non-inverting outputs. The 74AHC574; 74AHCT574 is functionally identical to

the 74AHC374; 74AHCT374, but has a different pinning.

2. Features

I Balanced propagation delays

I All inputs have a Schmitt-trigger action

I 3-state non-inverting outputs for bus orientated applications

I 8-bit positive, edge-triggered register

I Independent register and 3-state buffer operation

I Common 3-state output enable input

I For 74AHC574 only: operates with CMOS input levels

I For 74AHCT574 only: operates with TTL input levels

I ESD protection:

N HBM JESD22-A114E exceeds 2000 V

N MM JESD22-A115-A exceeds 200 V

N CDM JESD22-C101C exceeds 1000 V

I Multiple package options

I Specified from −40 °C to +85 °C and from −40 °C to +125 °C

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