74LVQ174 查看數據表（PDF） - STMicroelectronics

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74LVQ174

HEX D-TYPE FLIP FLOP WITH CLEAR

STMicroelectronics 

74LVQ174

Table 9: Capacitive Characteristics

Test Condition

Value

Symbol

Parameter

VCC

(V)

CIN Input Capacitance 3.3

CPD Power Dissipation

Capacitance

3.3

(note 1)

fIN = 10MHz

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

4

pF

23

pF

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without

load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/6 (per flip

flop)

Figure 4: Test Circuit

CL = 50pF or equivalent (includes jig and probe capacitance)

RL = R1 = 500Ω or equivalent

RT = ZOUT of pulse generator (typically 50Ω)

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