A1384LLHLT-T 查看數據表（PDF） - Allegro MicroSystems

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A1384LLHLT-T

Programmable Linear Hall Effect Sensors with Analog Output Available in a Miniature Thin Profile Surface Mount Package

Allegro MicroSystems 

A1381, A1382,

A1383, and A1384

Programmable Linear Hall Effect Sensors with Analog Output

Available in a Miniature Thin Profile Surface Mount Package

Programming Guidelines

Overview

Definition of Terms

Programming is accomplished by sending a series of input volt-

age pulses serially through the VOUT pin of the device. A unique

combination of different voltage level pulses controls the internal

programming logic of the device to select a desired program-

mable parameter and change its value. There are two program-

ming pulses, referred to as a high voltage pulse, VPH, consisting

of a VP(LOW) –VP(HIGH) –VP(LOW) sequence and a mid voltage

pulse, VPM, consisting of a VP(LOW) –VP(MID) –VP(LOW) sequence.

The 138x features Try mode, Blow mode, and Lock mode:

Register. The section of the programming logic that controls the

choice of programmable modes and parameters.

Bit Field. The internal fuses unique to each register, represented

as a binary number. Incrementing the bit field of a particular

register causes its programmable parameter to change, based on

the internal programming logic.

Key. A series of VPM voltage pulses used to select a register, with

a value expressed as the decimal equivalent of the binary value.

The LSB of a register is denoted as key 1, or bit 0.

• In Try mode, the value of a single programmable parameter may

be set and measured. The parameter value is stored temporar-

ily, and resets after cycling the supply voltage. Note that other

parameters cannot be accessed simultaneously in this mode.

• In Blow mode, the value of a single programmable parameter

may be permanently set by blowing solid-state fuses internal to

the device. Additional parameters may be blown sequentially.

• In Lock mode, a device-level fuse is blown, blocking the fur-

ther programming of all parameters.

The programming sequence is designed to help prevent the

device from being programmed accidentally; for example, as a

result of noise on the supply line.

Although any programmable variable power supply can be used

to generate the pulse waveforms, Allegro highly recommends

using the Allegro Sensor Evaluation Kit, available on the Allegro

Web site On-line Store. The manual for that kit is available for

download free of charge, and provides additional information on

programming these devices.

Code. The number used to identify the combination of fuses

activated in a bit field, expressed as the decimal equivalent of the

binary value. The LSB of a bit field is denoted as code 1, or bit 0.

Addressing. Incrementing the bit field code of a selected register

by serially applying a pulse train through the VOUT pin of the

device. Each parameter can be measured during the addressing

process, but the internal fuses must be blown before the program-

ming code (and parameter value) becomes permanent.

Fuse Blowing. Applying a VPH voltage pulse of sufficient dura-

tion at the VP(HIGH) level to permanently set an addressed bit by

blowing a fuse internal to the device. Once a bit (fuse) has been

blown, it cannot be reset.

Blow Pulse. A VPH voltage pulse of sufficient duration at the

VP(HIGH) level to blow the addressed fuse.

Cycling the Supply. Powering-down, and then powering-up the

supply voltage. Cycling the supply is used to clear the program-

ming settings in Try mode.

Programming Pulse Requirements, Protocol at TA = 25°C

Characteristic Symbol

Notes

Min. Typ. Max. Units

VP(LOW)

-

- 5.5 V

Programming Voltage VP(MID) Measured at the VOUT pin.

14 15 16 V

VP(HIGH)

26 27 28 V

Minimum supply current required to ensure proper fuse blowing. In addition, a min-

Programming Current

IP

imum capacitance, CBLOW = 0.1 μF, must be connected between the VOUT and

300 -

- mA

GND pins during programming to provide the current necessary for fuse blowing.

Pulse Width

Pulse Rise Time

Pulse Fall Time

tOFF(HIGH)

tOFF(MID)

tACTIVE(HIGH)

tACTIVE(MID)

tBLOW

tPr

tPf

Duration at VP(LOW) level following a VP(HIGH) level.

Duration at VP(LOW) level following a VP(MID) level.

Duration of VP(HIGH) level for VPH pulses during key/code selection.

Duration of VP(MID) level for VPH pulses during key/code selection.

Duration at VP(HIGH) level for fuse blowing.

Rise time required for transitions from VP(LOW) to either VP(MID) or VP(HIGH).

Fall time required for transitions from VP(HIGH) to either VP(MID) to VP(LOW).

30 -

- μs

5

-

- μs

30 -

- μs

15 -

- μs

30 -

- μs

1

- 100 μs

1

- 100 μs

Allegro MicroSystems, Inc.

11

115 Northeast Cutoff, Box 15036

Worcester, Massachusetts 01615-0036 (508) 853-5000

www.allegromicro.com

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