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ACPL-P314-000E(2009) 查看數據表(PDF) - Avago Technologies

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ACPL-P314-000E
(Rev.:2009)
AVAGO
Avago Technologies AVAGO
ACPL-P314-000E Datasheet PDF : 13 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
ACPL-P314 and ACPL-W314
0.6 Amp Output Current IGBT Gate Driver Optocoupler
Data Sheet
Lead (Pb) Free
RoHS 6 fully
compliant
RoHS 6 fully compliant options available;
-xxxE denotes a lead-free product
Description
The ACPL-P314/W314 consists of a GaAsP LED optically
coupled to an integrated circuit with a power output
stage. These optocouplers are ideally suited for driving
power IGBTs and MOSFETs used in motor control inverter
applications. The high operating voltage range of the
output stage provides the drive voltages required by
gate controlled devices. The voltage and current supplied
by this optocoupler makes it ideally suited for directly
driving small or medium power IGBTs.
Applications
Isolated IGBT/Power MOSFET gate drive
AC and brushless DC motor drives
Industrial inverters
Inverter for home appliances
Induction cooker
Switching Power Supplies (SPS)
Functional Diagram
ANODE 1
N.C. 2
CATHODE 3
SHIELD
6 VCC
5 VO
4 VEE
Truth Table
LED
VO
OFF
LOW
ON
HIGH
Note: A 0.1 µF bypass capacitor
must be connected between
pins VCC and VEE.
Features
High speed response.
Ultra high CMR.
Bootstrappable supply current.
Available in Stretched SO-6 package
Package Clearance/Creepage at 8mm (ACPL-W314)
Safety Approval:
UL Recognized with 3750 Vrms for 1 minute per
UL1577.
CSA Approved.
IEC/EN/DIN EN 60747-5-5 Approved
VIORM = 891Vpeak for ACPL-P314
VIORM = 1140Vpeak for ACPL-W314
Specifications
0.6 A maximum peak output current.
0.4 A minimum peak output current.
0.7 µs maximum propagation delay over temperature
range.
ICC(max) = 3 mA maximum supply current.
10 kV/µs minimum common mode rejection (CMR) at
VCM = 1000 V.
Wide VCC operating range: 10 V to 30 V over tempera-
ture range.
Wide operating temperature range: –40°C to 100°C.
CAUTION: It is advised that normal static precautions be taken in handling and assembly
of this component to prevent damage and/or degradation which may be induced by ESD.

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