AD5245(Rev0) 查看數據表（PDF） - Analog Devices

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AD5245
(Rev.:Rev0)

256-Position I2C Compatible Digital Potentiometer

Analog Devices 

AD5245

TEST CIRCUITS

Figure 27 to Figure 35 illustrate the test circuits that define the

test conditions used in the product specification tables.

DUT

A

V+

W

B

V+ = VDD

1LSB = V+/2N

VMS

Figure 27. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)

NO CONNECT

DUT

A

W

B

IW

VMS

Figure 28. Test Circuit for Resistor Position Nonlinearity Error

(Rheostat Operation; R-INL, R-DNL)

VMS2

DUT

A

W

B

IW = VDD / RNOMINAL

VW

VMS1 RW = [VMS1 – VMS2]/ IW

Figure 29. Test Circuit for Wiper Resistance

VA

VDD A

V+

W

B

( ) V+= VDD 10%

PSRR (dB) = 20 LOG

∆V MS

∆V DD

PSS (%/%) = ∆VMS%

∆V DD%

VMS

Figure 30. Test Circuit for Power Supply Sensitivity (PSS, PSSR)

OFFSET

GND

A

VIN

DUT B

W

5V

OP279

OFFSET

BIAS

VOUT

Figure 31. Test Circuit for Inverting Gain

5V

OFFSET

GND

OP279

VIN

W

A DUT B

OFFSET

BIAS

VOUT

Figure 32. Test Circuit for Noninverting Gain

A

W

VIN

DUT

OFFSET

GND

B

2.5V

+15V

AD8610

–15V

VOUT

Figure 33. Test Circuit for Gain vs. Frequency

DUT

W

B

RSW =

0.1V

ISW

CODE = 0x00

ISW

0.1V

VSS TO VDD

Figure 34. Test Circuit for Incremental ON Resistance

NC

VDD DUT

A

W

ICM

VSS GND

B

VCM

NC NC = NO CONNECT

Figure 35. Test Circuit for Common-Mode Leakage current

Rev. 0 | Page 10 of 16

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