AD5245
TEST CIRCUITS
Figure 28 to Figure 34 illustrate the test circuits that define the test conditions used in the product specification tables (Table 1 through Table 3).
DUT
A
W
V+
B
V+ = VDD
1LSB = V+/2N
VMS
Figure 28. Test Circuit for Potentiometer Divider Nonlinearity Error
(INL, DNL)
NO CONNECT
DUT
AW
B
IW
VMS
Figure 29. Test Circuit for Resistor Position Nonlinearity Error
(Rheostat Operation; R-INL, R-DNL)
VMS2
DUT
A
W
B
IW = VDD/RNOMINAL
VW
RW = [VMS1 – VMS2]/IW
VMS1
Figure 30. Test Circuit for Wiper Resistance
VA
VDD A
V+
W
B
( ) V+ = VDD ±10%
PSRR (dB) = 20 log
∆VMS
∆VDD
PSS (%/%) = ∆VMS%
∆VDD%
VMS
Figure 31. Test Circuit for Power Supply Sensitivity (PSS, PSSR)
VIN
OFFSET
GND
2.5V
DUT
AW
B
+15V
AD8610
VOUT
–15V
Figure 32. Test Circuit for Gain vs. Frequency
DUT
W
B
RSW =
0.1V
ISW
CODE = 0x00
ISW
0.1V
GND TO VDD
Figure 33. Test Circuit for Incremental On Resistance
NC
DUT
VDD
AW
ICM
GND B
VCM
NC NC = NO CONNECT
Figure 34. Test Circuit for Common-Mode Leakage Current
Rev. B | Page 12 of 20