AD5522 查看數據表（PDF） - Analog Devices

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AD5522

Quad Parametric Measurement Unit with Integrated 16-Bit Level Setting DACs

Analog Devices 

AD5522

Parameter

CURRENT CLAMPS

Clamp Accuracy

CLL to CLH2

Recovery Time2

Activation Time2

FOHx, EXTFOHx, EXTMEASILx,

EXTMEASIHx, CFFx PINS

Pin Capacitance2

Leakage Current

Leakage Current Tempco2

MEASVHx PIN

Pin Capacitance2

Leakage Current

Leakage Current Tempco2

SYS_SENSE PIN

Pin Capacitance2

Switch Impedance

Leakage Current

Leakage Current Tempco2

SYS_FORCE PIN

Pin Capacitance2

Switch Impedance

Leakage Current

Leakage Current Tempco2

COMBINED LEAKAGE AT DUT

Leakage Current

Leakage Current Tempco2

DUTGNDx PIN

Voltage Range

Leakage Current

MEASOUTx PIN

Output Voltage Span

Output Impedance

Output Leakage Current

Output Capacitance2

Maximum Load Capacitance2

Output Current Drive2

Short-Circuit Current

Slew Rate2

Enable Time2

Disable Time2

MI to MV Switching Time2

Data Sheet

Min

Typ1 Max

Unit

Test Conditions/Comments

Programmed

clamp value

Programmed

clamp value

5

10

0.5

1.5

Programmed

clamp value ± 10

Programmed

clamp value ± 20

1.5

3

% FSC

% FSC

% of IRANGE

% of IRANGE

μs

μs

MI gain = 10, clamp current scales with selected

range

MI gain = 5, clamp current scales with selected range

CLL < CLH and minimum setting apart, MI gain = 10

CLL < CLH and minimum setting apart, MI gain = 5

−3

−3

−3

−3

−15

−25

−500

−30

−3

−10

10

+3

±0.01

3

+3

±0.01

3

1

1.3

+3

±0.01

6

60

80

+3

±0.01

+15

+25

±0.1

+500

+30

22.5

60

80

+3

15

0.5

2

+10

2

150 320

400 1100

200

pF

nA

nA/°C

pF

nA

nA/°C

pF

kΩ

nA

nA/°C

pF

Ω

nA

nA/°C

nA

nA

nA/°C

mV

nA

V

Ω

nA

pF

μF

mA

mA

V/μs

ns

ns

ns

Individual pin on or off switch leakage, measured with

±11 V stress applied to pin, channel enabled, but tristate

Measured with ±11 V stress applied to pin, channel

enabled, but tristate

SYS_SENSE connected, force amplifier inhibited

Measured with ±11 V stress applied to pin, switch off

SYS_FORCE connected, force amplifier inhibited

Measured with ±11 V stress applied to pin, switch off

Includes FOHx, MEASVHx, SYS_SENSE, SYS_FORCE,

EXTMEASILx, EXTMEASIHx, EXTFOHx, and CFFx,

calculation of all the individual leakage contributors

TJ = 25°C to 70°C

TJ = 25°C to 90°C

With respect to AGND

Software programmable output range

With SW12 off

Closing SW12, measured from BUSY rising edge

Opening SW12, measured from BUSY rising edge

Measured from BUSY rising edge, does not include

slewing or settling

Rev. F | Page 8 of 64

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