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AD6652 查看數據表(PDF) - Analog Devices

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AD6652 Datasheet PDF : 76 Pages
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AD6652
ABSOLUTE MAXIMUM RATINGS
Table 8.
Parameter
Rating
ELECTRICAL
AVDD Voltage
−0.3 V to +3.9 V
VDD Voltage
−0.3 V to +2.75 V
VDDIO Voltage
−0.3 V to +3.9 V
AGND, DGND
−0.3 V to +0.3 V
ADC VINA, VINB Analog Input Voltage −0.3 V to AVDD + 0.3 V
ADC Digital Input Voltage
−0.3 V to AVDD + 0.3 V
ADC OTRA, OTRB Digital Output Voltage
−0.3 V to VDDIO + 0.3 V
ADC VREF, REFA, REFB Input Voltage −0.3 V to AVDD + 0.3 V
DDC Digital Input Voltage
−0.3 V to VDDIO + 0.3 V
DDC Digital Output Voltage
−0.3 V to VDDIO + 0.3 V
ENVIRONMENTAL
Operating Temperature Range
(Ambient)
−40°C to +85°C
Maximum Junction Temperature
Under Bias
150°C
Storage Temperature Range (Ambient) −65°C to +150°C
Stresses above those listed under the Absolute Maximum
Ratings may cause permanent damage to the device. This is a
stress rating only; functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL CHARACTERISTICS
256-lead CSPBGA, 17 mm sq.
θJA = 23°C/W, still air.
Estimate based on JEDEC JC51-2 model using horizontally
positioned 4-layer board.
TEST LEVEL
I. 100% production tested.
II. 100% production tested at 25°C.
III. Sample tested only.
IV. Parameter guaranteed by design and characterization testing.
V. Parameter is a typical value only.
VI. 100% production tested at 25°C; guaranteed by design and
characterization testing for industrial temperature range.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. 0 | Page 10 of 76

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