AD9814S 查看數據表（PDF） - Analog Devices

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AD9814S

14-Bit CCD/CIS Signal Processor

Analog Devices 

AD9814S

6.0 Table II. Electrical Test Requirements:

Test Requirements

Table II

Interim Electrical Parameters

Final Electrical Parameters

Group A Test Requirements

Group C end-point electrical parameters

Group D end-point electrical parameters

Group E end-point electrical parameters

Subgroups (in accordance with

MIL-PRF-38535, Table III)

1

1, 2, 3 1/ 2/

1, 2, 3

1 2/

1

N/A

Notes:

1/ PDA applies to Subgroup 1. Delta’s excluded from PDA.

2/ See Table III for Delta limits.

7.0 Table III. Life Test / Burn-in Delta limits:

Test Symbol

Table III

Delta Limit

Units

IAVDD

VOS

GAIN

+/-2

+/-13.2

(+/-54)

+/-0.56

(+/-91)

mA

mV

(LSB)

%

(LSB)

+INL

+/-6

LSB

-INL

+/-5

LSB

+DNL

+/-0.5

LSB

-DNL

+/-0.35

LSB

8.0 Life Test / Burn-In Circuit:

8.1 HTRB is not applicable for this drawing.

8.2 Burn-in is per MIL-STD-883 Method 1015, test condition D.

8.3 Steady state life test is per MIL-STD-883 Method 1005, test condition D.

9.0 MIL-STD-38535 QMLV exceptions:

9.1 Full WLA per MIL-STD-883 TM 5007 is not available for this product. SEM Inspection only is available per

MIL-STD-883, TM2018.

9.2 This product is manufactured in a MIL-PRF-38535 QMLQ certified wafer fab facility.

ASD0016515 Rev. D | Page 6 of 7

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