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ADC0801S040 查看數據表(PDF) - NXP Semiconductors.

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ADC0801S040
NXP
NXP Semiconductors. NXP
ADC0801S040 Datasheet PDF : 19 Pages
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NXP Semiconductors
ADC0801S040
Single 8 bits ADC, up to 40 MHz
Table 6. Characteristics …continued
VDDA = V5 to V6 = 3.3 V; VDDD = V3 to V4 = 3.3 V; VDDO = V20 to V11 = 3.3 V; VSSA, VSSD and VSSO shorted together; Vi(a)(p-p)
= 1.84 V; CL = 20 pF; Tamb = 0 °C to 70 °C; typical values measured at Tamb = 25 °C unless otherwise specified.
Symbol Parameter
Conditions
Min
Typ
Max
Unit
Differential phase[7]
ϕdif
differential phase
PAL modulated ramp
-
0.25
-
deg
Timing (fclk = 40 MHz; CL = 20 pF); see Figure 4[8]
td(s)
sampling delay time
-
-
5
ns
th(o)
output hold time
5
-
-
ns
td(o)
output delay time
VDDO = 4.75 V
8
12
15
ns
VDDO = 3.15 V
8
17
20
ns
VDDO = 2.7 V
8
18
21
ns
3-state output delay times; see Figure 5
tdHZ
active HIGH to float
delay time
-
14
18
ns
tdZL
float to active LOW delay
time
-
16
20
ns
tdZH
float to active HIGH
delay time
-
16
20
ns
tdLZ
active LOW to float delay
time
-
14
18
ns
[1] In addition to a good layout of the digital and analog ground, it is recommended that the rise and fall times of the clock must not be less
than 1 ns.
[2] Analog input voltages producing code 0 up to and including code 255:
a) Voffset BOTTOM is the difference between the analog input which produces data equal to 00 and the reference voltage on pin RB
(VRB) at Tamb = 25 °C.
b) Voffset TOP is the difference between the reference voltage on pin RT (VRT) and the analog input which produces data outputs equal
to code 255 at Tamb = 25 °C.
[3] To ensure the optimum linearity performance of such a converter architecture the lower and upper extremities of the converter reference
resistor ladder are connected to pins RB and RT via offset resistors ROB and ROT as shown in Figure 3.
a) The current flowing into the resistor ladder is I = -------V-----R---T---------V----R---B--------- and the full-scale input range at the converter, to cover code 0
ROB + RL + ROT
to 255 is
VI
=
RL × IL
=
------------------R---L-------------------
ROB + RL + ROT
×
(V RT
+
V
RB)
=
0.838 × (V RT V RB)
b)
Since
RL,
ROB
and
ROT
have
similar
behavior
with
respect
to
process
and
temperature
variation,
the
ratio
------------------R---L-------------------
ROB + RL + ROT
will be kept reasonably constant from device to device. Consequently variation of the output codes at a given input voltage depends
mainly on the difference VRT VRB and its variation with temperature and supply voltage. When several ADCs are connected in
parallel and fed with the same reference source, the matching between each of them is optimized.
[4] The analog bandwidth is defined as the maximum input sine wave frequency which can be applied to the device. No glitches greater
than 2 LSB, nor any significant attenuation is observed in the reconstructed signal.
[5] The analog input settling time is the minimum time required for the input signal to be stabilized after a sharp full-scale input (square
wave signal) in order to sample the signal and obtain correct output data.
[6] Effective bits are obtained via a Fast Fourier Transform (FFT) treatment taking 8000 acquisition points per equivalent fundamental
period. The calculation takes into account all harmonics and noise up to half of the clock frequency (Nyquist frequency). Conversion to
signal-to-noise ratio: S/N = ENOB × 6.02 + 1.76 dB.
[7] Measurement carried out using video analyzer VM700A, where video analog signal is reconstructed through a DAC.
[8] Output data acquisition: the output data is available after the maximum delay time of td(o).
ADC0801S040_2
Product data sheet
Rev. 02 — 18 August 2008
© NXP B.V. 2008. All rights reserved.
8 of 19

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