ADE7768ARZ-RL 查看數據表（PDF） - Analog Devices

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ADE7768ARZ-RL

Energy Metering IC with Integrated Oscillator and Positive Power Accumulation

Analog Devices 

ABSOLUTE MAXIMUM RATINGS

TA = 25°C, unless otherwise noted.

Table 3.

Parameter

VDD to AGND

VDD to DGND

Analog Input Voltage to AGND,

V1P, V1N, V2P, and V2N

Reference Input Voltage to AGND

Digital Input Voltage to DGND

Digital Output Voltage to DGND

Operating Temperature Range

Storage Temperature Range

Junction Temperature

16-Lead Plastic SOIC, Power Dissipation

θJA Thermal Impedance1

Package Temperature Soldering

1 JEDEC 1S standard (2-layer) board data.

Value

−0.3 V to +7 V

−0.3 V to +7 V

−6 V to +6 V

−0.3 V to VDD + 0.3 V

−0.3 V to VDD + 0.3 V

−0.3 V to VDD + 0.3 V

−40°C to +85°C

−65°C to +150°C

150°C

350 mW

124.9°C/W

See J-STD-20

ADE7768

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

rating only and functional operation of the device at these or

any other conditions above those indicated in the operational

section of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect

device reliability.

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on

the human body and test equipment and can discharge without detection. Although this product features

proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy

electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degrada-

tion or loss of functionality.

Rev. A | Page 5 of 20

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