ADG506ABQ 查看數據表（PDF） - Analog Devices

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ADG506ABQ

CMOS 8-/16-Channel Analog Multiplexers

Analog Devices 

ADG506A/ADG507A–Test Circuits

Note: All Digital Input Signal Rise and Fall Times Measured from 10% to 90% of 3 V. tR = tF = 20 ns.

Test Circuit 1. RON

Test Circuit 2. IS (OFF)

Test Circuit 3. ID (OFF)

Test Circuit 4. ID (ON)

Test Circuit 5. IDIFF

Test Circuit 6. Switching Time of Multiplexer, tTRANSITION

Test Circuit 7. Break-Before-Make Delay, tOPEN

–6–

REV. C

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