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ADS6442IRGCT 查看數據表(PDF) - STMicroelectronics

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ADS6442IRGCT Datasheet PDF : 75 Pages
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www.ti.com
PACKAGE/ORDERING INFORMATION(1)
ADS6445, ADS6444
ADS6443, ADS6442
SLAS531 – MAY 2007
PRODUCT
PACKAGE-LEAD
PACKAGE
DESIGNATOR
SPECIFIED
TEMPERATURE
RANGE
PACKAGE
MARKING
ADS6445
QFN-64 (2)
RGC
–40°C to 85°C
AZ6445
ADS6444
QFN-64 (2)
RGC
–40°C to 85°C
AZ6444
ADS6443
QFN-64 (2)
RGC
–40°C to 85°C
AZ6443
ADS6442
QFN-64 (2)
RGC
–40°C to 85°C
AZ6442
ORDERING NUMBER
ADS6445IRGCT
ADS6445IRGCR
ADS6444IRGCT
ADS6444IRGCR
ADS6443IRGCT
ADS6443IRGCR
ADS6442IRGCT
ADS6442IRGCR
TRANSPORT
MEDIA,
QUANTITY
250, Tape/reel
2000, Tape/reel
250, Tape/reel
2000, Tape/reel
250, Tape/reel
2000, Tape/reel
250, Tape/reel
2000, Tape/reel
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) For thermal pad size on the package, see the mechanical drawings at the end of this data sheet. θJA = 23.17 °C/W (0 LFM air flow), θJC
= 22.1 °C/W when used with 2 oz. copper trace and pad soldered directly to a JEDEC standard four layer 3 in. x 3 in. PCB.
ABSOLUTE MAXIMUM RATINGS(1)
AVDD
LVDD
TA
TJ
Tstg
Supply voltage range
Supply voltage range
Voltage between AGND and DGND
Voltage between AVDD to LVDD
Voltage applied to external pin, VCM
Voltage applied to analog input pins
Operating free-air temperature range
Operating junction temperature range
Storage temperature range
Lead temperature 1,6 mm (1/16") from the case for 10 seconds
VALUE
–0.3 to 3.9
–0.3 to 3.9
–0.3 to 0.3
–0.3 to 3.3
–0.3 to 2.0
– 0.3V to minimum ( 3.6, AVDD + 0.3V)
–40 to 85
125
–65 to 150
220
UNIT
V
V
V
V
V
V
°C
°C
°C
°C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
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