AH477AZ4-AG1 查看數據表（PDF） - BCD Semiconductor

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AH477AZ4-AG1

SINGLE PHASE HALL EFFECT LATCH

BCD Semiconductor 

SINGLE PHASE HALL EFFECT LATCH

Absolute Maximum Ratings (Note 1)

(TA=25oC)

Parameter

Supply Voltage

Magnetic Flux Density

Output Current

Power Dissipation

Continuous

Hold

Peak (start up)

Thermal Resistance

Die to atmosphere

Die to package case

Storage Temperature

ESD (Machine Model)

ESD (Human Body Model)

Symbol

VCC

B

IO

PD

θJA

θJC

TSTG

Data Sheet

AH477A

Value

20

Unlimited

250

300

600

550

227

49

-50 to 150

600

6000

Unit

V

Gauss

mA

mA

mA

mW

oC/W

oC/W

oC

V

V

Note 1: Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.

These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated

under "Recommended Operating Conditions" is not implied. "Absolute Maximum Ratings" for extended period may affect

device reliability.

Recommended Operating Conditions

(TA=25oC)

Parameter

Supply Voltage

Frequency (PWM Power)

Ambient Temperature

Symbol

Min

Max

Unit

VCC

3.5

18

V

f

0.1

25

kHz

TA

-20

85

oC

Oct. 2009 Rev. 1. 2

BCD Semiconductor Manufacturing Limited

4

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