M28256-25NS1T 查看數據表（PDF） - STMicroelectronics
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M28256-25NS1T Datasheet PDF : 20 Pages
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M28256
Table 6. Input and Output Parameters1 (TA = 25 °C, f = 1 MHz)
Symbol
Parameter
Test Condition
CIN
Input Capacitance
VIN = 0 V
COUT
Output Capacitance
Note: 1. Sampled only, not 100% tested.
VOUT = 0 V
Table 7. AC Measurement Conditions
Input Rise and Fall Times
Input Pulse Voltages (M28256)
Input Pulse Voltages (M28256-W)
Input and Output Timing Reference Voltages (M28256)
Input and Output Timing Reference Voltages (M28256-W)
Min.
Max.
Unit
6
pF
12
pF
≤ 20 ns
0.4 V to 2.4 V
0 V to VCC–0.3V
0.8 V to 2.0 V
0.5 VCC
Figure 7. AC Testing Input Output Waveforms
4.5V to 5.5V Operating Voltage
2.4V
0.4V
2.0V
0.8V
2.7V to 3.6V Operating Voltage
VCC – 0.3V
0V
0.5 VCC
AI02101B
Figure 8. AC Testing Equivalent Load Circuit
IOL
DEVICE
UNDER
TEST
IOH
CL includes JIG capacitance
OUT
CL = 100pF
AI02102B
Table 8A. Read Mode AC Characteristics for M28256 (5V range)
(TA = 0 to 70 °C or -40 to 85 °C; VCC = 4.5 to 5.5 V)
Symbol Alt.
Parameter
Test
Conditi
on
-90
Min Max
M28256
-12
-15
Min Max Min Max
-20
Min Max
Unit
tAVQV tACC Address Valid to Output Valid
E = VIL,
G = VIL
90
120
150
200 ns
tELQV tCE Chip Enable Low to Output Valid G = VIL
90
120
150
200 ns
tGLQV tOE Output Enable Low to Output Valid E = VIL
40
45
50
50 ns
tEHQZ1 tDF Chip Enable High to Output Hi-Z G = VIL 0 40 0 45 0 50 0 50 ns
tGHQZ1 tDF Output Enable High to Output Hi-Z E = VIL 0 40 0 45 0 50 0 50 ns
tAXQX
tOH
Address Transition to Output
Transition
E = VIL,
G = VIL
0
0
0
0
ns
Note: 1. Output Hi-Z is defined as the point at which data is no longer driven.
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