CXK582000M 查看數據表（PDF） - Sony Semiconductor

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CXK582000M

262144-word × 8-bit High Speed CMOS Static RAM

Sony Semiconductor 

CXK582000TM/YM/M

I/O capacitance

Item

Symbol Test conditons Min.

Input capacitance

CIN

VIN = 0V

—

I/O capacitance

CI/O

VI/O = 0V

—

Note) This parameter is sampled and is not 100% tested.

(Ta = 25°C, f = 1MHz)

Typ. Max. Unit

—

7 pF

—

8 pF

AC Characteristics

• AC test conditions

(VCC = 5V ± 10%, Ta = 0 to +70°C)

Item

Input pulse high level

Input pulse low level

Input rise time

Input fall time

Conditions

VIH = 2.2V

VIL = 0.8V

tr = 5ns

tf = 5ns

Input and output reference level

Output load conditions

1.5V

CL∗ = 100pF, 1TTL

∗ CL includes scope and jig capacitances.

TTL

CL

–4–

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