AT29LV020-25TI_ 查看數據表（PDF） - Atmel Corporation
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AT29LV020-25TI_ Datasheet PDF : 10 Pages
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AC Read Characteristics
Symbol Parameter
tACC
tCE (1)
tOE (2)
tDF (3, 4)
Address to Output Delay
CE to Output Delay
OE to Output Delay
CE or OE to Output Float
tOH
Output Hold from OE, CE or Address,
whichever occurred first
AC Read Waveforms (1, 2, 3, 4)
AT29LV020
AT29LV020-20
Min
Max
200
200
0
100
0
50
0
AT29LV020-25
Min
Max
250
250
0
120
0
60
0
Units
ns
ns
ns
ns
ns
Notes: 1. CE may be delayed up to tACC - tCE after the address
transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling
edge of CE without impact on tCE or by tACC - tOE
after an address change without impact on tACC.
3. tDF is specified from OE or CE whichever occurs first
(CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
Input Test Waveforms and Measurement Level
Output Test Load
tR, tF < 5 ns
Pin Capacitance (f = 1 MHz, T = 25°C) (1)
Typ
Max
CIN
4
6
COUT
8
12
Note: 1. These parameters are characterized and not 100% tested.
Units
pF
pF
Conditions
VIN = 0V
VOUT = 0V
4-77
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