AT29LV512 查看數據表（PDF） - Atmel Corporation

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AT29LV512

512K (64K x 8) 3-volt Only Flash Memory

Atmel Corporation 

AT29LV512

4.7 Toggle Bit

In addition to DATA polling, the AT29LV512 provides another method for determining the end of

a program or erase cycle. During a program or erase operation, successive attempts to read

data from the device will result in I/O6 toggling between one and zero. Once the program cycle

has completed, I/O6 will stop toggling and valid data will be read. Examining the toggle bit may

begin at any time during a program cycle.

4.8 Optional Chip Erase Mode

The entire device can be erased by using a 6-byte software code. Please see Software Chip

Erase application note for details.

5. Absolute Maximum Ratings*

Temperature Under Bias............................... -55° C to +125° C

Storage Temperature .................................... -65° C to +150° C

All Input Voltages (including NC Pins)

with Respect to Ground ...................................-0.6V to +6.25V

All Output Voltages

with Respect to Ground .............................-0.6V to VCC + 0.6V

Voltage on A9 (including NC Pins)

with Respect to Ground ...................................-0.6V to +13.5V

*NOTICE:

Stresses beyond those listed under “Absolute

Maximum Ratings” may cause permanent dam-

age to the device. This is a stress rating only and

functional operation of the device at these or any

other conditions beyond those indicated in the

operational sections of this specification is not

implied. Exposure to absolute maximum rating

conditions for extended periods may affect

device reliability

5

0177O–FLASH–9/08

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