BS62LV2003TC-70 查看數據表（PDF） - Brilliance Semiconductor
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BS62LV2003TC-70 Datasheet PDF : 10 Pages
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BSI
DC ELECTRICAL CHARACTERISTICS ( TA = 0oC to + 70oC )
PARAMETER
NAME
VIL
VIH
IIL
PARAMETER
Guaranteed Input Low
Voltage(2)
Guaranteed Input High
Voltage(2)
Input Leakage Current
TEST CONDITIONS
Vcc=3.0V
Vcc = Max, VIN = 0V to Vcc
Vcc=3.0V
IOL
Output Leakage Current
Vcc = Max, CE1= VIH, CE2= VIL, or
OE = VIH, VI/O = 0V to Vcc
VOL
Output Low Voltage
Vcc = Max, IOL = 2mA
Vcc=3.0V
VOH
Output High Voltage
Vcc = Min, IOH = -1mA
Vcc=3.0V
ICC
Operating Power Supply CE1 = VIL, or CE2 = VIH,
Current
IDQ = 0mA, F = Fmax(3)
Vcc=3.0V
ICCSB
Standby Current-TTL
CE1 = VIH, or CE2 = VIL,
IDQ = 0mA, F = Fmax(3)
Vcc=3.0V
ICCSB1
Standby Current-CMOS
CE1ЊVcc-0.2V, CE2Љ0.2V,
VINЊVcc-0.2V or VINЉ0.2V
Vcc=3.0V
BS62LV2003
MIN. TYP. (1) MAX.
UNITS
-0.5
--
0.8
V
2.0
--
Vcc+0.2
V
--
--
1
uA
--
--
1
uA
--
--
0.4
V
2.4
--
--
V
--
--
20
mA
--
--
1
mA
--
0.1
0.7
uA
1. Typical characteristics are at TA = 25oC.
2. These are absolute values with respect to device ground and all overshoots due to system or tester notice are included.
3. Fmax = 1/tRC .
DATA RETENTION CHARACTERISTICS ( TA = 0oC to + 70oC )
SYMBOL
PARAMETER
TEST CONDITIONS
MIN. TYP. (1) MAX.
UNITS
VDR
Vcc for Data Retention
CE1 Њ Vcc - 0.2V, CE2 Љ 0.2V,
VIN Њ Vcc - 0.2V or VIN Љ 0.2V
1.5
--
--
V
ICCDR
Data Retention Current
CE1 Њ Vcc - 0.2V, CE2 Љ 0.2V,
VIN Њ Vcc - 0.2V or VIN Љ 0.2V
--
0.01
0.5
uA
tCDR
Chip Deselect to Data
Retention Time
See Retention Waveform
tR
Operation Recovery Time
0
--
--
ns
TRC (2)
--
--
ns
1. Vcc = 1.5V, TA = + 25OC
2. tRC = Read Cycle Time
LOW VCC DATA RETENTION WAVEFORM (1) ( CE1 Controlled )
Vcc
CE1
Vcc
t CDR
VIH
Data Retention Mode
VDR ≥ 1.5V
CE1 ≥ Vcc - 0.2V
Vcc
tR
VIH
LOW VCC DATA RETENTION WAVEFORM (2) ( CE2 Controlled )
Data Retention Mode
Vcc
Vcc
t CDR
VDR Њ 1.5V
Vcc
tR
CE2
VIL
CE2 Љ 0.2V
VIL
R0201-BS62LV2003
3
Revision 2.4
April 2002
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