AS7C33128PFS36A-133TQI 查看數據表（PDF） - Alliance Semiconductor
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AS7C33128PFS36A-133TQI Datasheet PDF : 13 Pages
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AS7C33128PFS32A
AS7C33128PFS36A
®
AC test conditions
• Output load: see Figure B, except for tLZC, tLZOE, tHZOE, tHZC, see Figure C.
• Input pulse level: GND to 3V. See Figure A.
• Input rise and fall time (measured at 0.3V and 2.7V): 2 ns. See Figure A.
• Input and output timing reference levels: 1.5V.
+3.0V
90%
10%
GND
90%
10%
DOUT
Z0 = 50Ω
50Ω
VL = 1.5V
for 3.3V I/O;
30 pF* = VDDQ/2
for 2.5V I/O
DOUT
353Ω / 1538Ω
Thevenin equivalent:
+3.3V for 3.3V I/O;
/+2.5V for 2.5V I/O
319Ω / 1667Ω
5 pF*
GND *including scope
and jig capacitance
Figure A: Input waveform
Figure B: Output load (A)
Figure C: Output load (B)
Notes
1 For test conditions, see AC Test Conditions, Figures A, B, C.
2 This parameter measured with output load condition in Figure C.
3 This parameter is sampled, but not 100% tested.
4 tHZOE is less than tLZOE; and tHZC is less than tLZC at any given temperature and voltage.
5 tCH measured as HIGH above VIH and tCL measured as LOW below VIL.
6 This is a synchronous device. All addresses must meet the specified setup and hold times for all rising edges of CLK. All other synchronous inputs must meet
the setup and hold times for all rising edges of CLK when chip is enabled.
7 Write refers to GWE, BWE, BW[a:d].
8 Chip select refers to CE0, CE1, CE2.
Package Dimensions
100-pin quad flat pack (TQFP)
TQFP
Min Max
A1
0.05
0.15
A2
1.35
1.45
b
0.22
0.38
c
0.09
0.20
D
13.90
14.10
E
19.90
20.10
e
0.65 nominal
Hd
15.90
16.10
He
21.90
22.10
L
0.45
0.75
L1
1.00 nominal
α
0°
7°
Dimensions in millimeters
Hd
D
b
e
He E
α
c
L1
L
A1 A2
3/4/02; v.1.4
Alliance Semiconductor
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