CF5035ALB 查看數據表（PDF） - Nippon Precision Circuits

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CF5035ALB

1.8V, High-frequency Crystal Oscillator Module ICs

Nippon Precision Circuits  

CF5035 series

MEASUREMENT CIRCUITS

Measurement cct 1

Measurement parameter: IDD, IST, Duty, tr , tf

Measurement cct 4

Measurement parameter: VIH, VIL

IDD

A

IST

VDD

XIN

X'tal

Q

XOUT

INHN VSS

IDD: Open

IST: Short

CL = 15pF

(Including probe

capacitance)

VDD

XIN

X'tal

Q

XOUT

INHN VSS

VIH

VIL

V

Note: The AC characteristics are observed using an oscilloscope on

pin Q.

VIH: Voltage in VSS to VDD transition that changes the output state.

VIL: Voltage in VDD to VSS transition that changes the output state.

INHN has an oscillation stop function.

Measurement cct 2

Measurement parameter: tOE, tOD

Measurement cct 5

Measurement parameter: IZ

VDD

Signal

C1

Generator

R1

Q

XOUT

INHN VSS

VDD

or

VSS

XIN input signal: 1Vp-p, sine wave

C1: 0.001µF

R1: 50Ω

Measurement cct 3

Measurement parameter: VOH, VOL

VDD

Q

INHN VSS

VDD

A

or

VSS

IZ

Measurement cct 6

Measurement parameter: RPU1, RPU2

VDD

VDD

50Ω

Signal

0.001µF

XOUT

Q

Generator

50Ω

VSS

VOH

VOL

V

0.1µF

VS

∆V

VOH

VS VS

VOL

∆V

VS adjusted such that ∆V =

50 × IOH.

VS adjusted such that ∆V =

50 × IOL.

XOUT input signal: 1Vp-p, sine wave

INHN VSS

VIN V A IPU

RPU1 =

VDD

IPU

(VIN = 0V)

RPU2 =

VDD

0.7VDD

IPU

(VIN = 0.7VDD)

SEIKO NPC CORPORATION —7

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