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CM1219 Datasheet PDF : 5 Pages
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CM1219
Low Capacitance Transient
Voltage Suppressors
/ ESD Protectors
Description
The CM1219 family of devices features transient voltage
suppressor arrays that provide a very high level of protection for
sensitive electronic components which may be subjected to
electrostatic discharge (ESD).
All pins of the CM1219 are rated to withstand ±8 kV ESD pulses
using the IEC 61000−4−2 contact discharge method. Using the
MIL−STD−883D (Method 3015) specification for Human Body
Model (HBM) ESD, all pins are protected from contact discharges of
greater than ±15 kV.
Features
• Functionally and Pin Compatible with CMD’s PACDN1408 ESD
Protection Device
• Low I/O Capacitance at 4 pF Typical
• In−system ESD Protection to ±8 kV Contact Discharge, per the
IEC 61000−4−2 International Standard
• Five Channels of ESD Protection
• Compact SMT Package Saves Board Space and Facilitates Layout in
Space−critical Applications
• Each I/O Pin Can Withstand over 1000 ESD Strikes*
• These are Pb−Free Devices
Applications
• High−speed Consumer Electronic Ports
• ESD Protection of PC Ports, Including USB Ports, Serial Ports,
Parallel Ports, IEEE1394 Ports, Docking Ports, Proprietary Ports, etc.
• Protection of Interface Ports or IC Pins which are Exposed to High
ESD Levels
http://onsemi.com
6
1
SOT−563
SE SUFFIX
CASE 463A
BLOCK DIAGRAM
6
5
4
1
2
3
VN
SOT−563
MARKING DIAGRAM
S5R M G
1
S5R = Specific Device Code
M = Month Code
G = Pb−Free Package
ORDERING INFORMATION
Device
Package
Shipping†
CM1219−05SE
SOT−563 5000/Tape & Reel
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
*Standard test condition is IEC61000−4−2 level 4 test circuit with each pin subjected to ±8kV contact discharge for 1000 pulses. Discharges
are timed at 1 second intervals and all 1000 strikes are completed in one continuous test run. The part is then subjected to standard production
test to verify that all of the tested parameters are within spec after the 1000 strikes.
© Semiconductor Components Industries, LLC, 2011
1
January, 2011 − Rev. 3
Publication Order Number:
CM1219/D
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