CM1230(2010) 查看數據表（PDF） - ON Semiconductor

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CM1230
(Rev.:2010)

2, 4, and 8-Channel Low-Capacitance ESD Protection Array

ON Semiconductor 

CM1230

*Standard test condition is IEC61000-4-2 level 4 test circuit with each (A /B ) pin subjected to ±12kV contact discharge for 1000 pulses. Discharges are timed at 1 second intervals and all 1000 strikes are completed in one

OUT OUT

continuous test run.

Rev.3 | Page 2 of 16 | www.onsemi.com

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