CM1236 查看數據表（PDF） - ON Semiconductor
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CM1236 Datasheet PDF : 14 Pages
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CM1236
Figure 6. Test Setups: Standard Device (Left) and CM1235 (Right)
Figure 7. Typical Channel TDR Measured Across Out_x and In_x Per Each Differential Channels Pair
(Typical 200ps Incident Rise Time)
Rev. 3 | Page 10 of 14 | www.onsemi.com
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