CXK58512M 查看數據表（PDF） - Sony Semiconductor

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CXK58512M

65536-word × 8-bit High Speed CMOS Static RAM

Sony Semiconductor 

I/O capacitance

Item

Symbol Test conditons Min.

Input capacitance

CIN

VIN = 0V

—

I/O capacitance

CI/O

VI/O = 0V

—

Note) This parameter is sampled and is not 100% tested.

(Ta = 25°C, f = 1MHz)

Typ. Max. Unit

—

7 pF

—

8 pF

CXK58512TM/M

AC Characteristics

• AC test conditions

(VCC = 5V ± 10%, Ta = 0 to +70°C)

Item

Conditions

Input pulse high level

VIH = 2.2V

Input pulse low level

VIL = 0.8V

Input rise time

tr = 5ns

Input fall time

tf = 5ns

Input and output reference level

1.5V

Output load conditions

-55LL

CL∗ = 30pF, 1TTL

-70LL/10LL CL∗ = 100pF, 1TTL

∗ CL includes scope and jig capacitances.

• Test circuit

TTL

CL

–4–

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