CY7C261-20JC 查看數據表（PDF） - Cypress Semiconductor

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CY7C261-20JC

8K x 8 Power-Switched and Reprogrammable PROM

Cypress Semiconductor 

CY7C261

CY7C263/CY7C264

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Electrical Characteristics Over the Operating Range[3,4]

7C261-20, 25

7C263-20, 25

7C264-20, 25

7C261-35, 45, 55

7C263-35, 45, 55

7C264-35, 45, 55

Parameter

Description

Test Conditions

Min. Max. Min. Max.

VOH

Output HIGH Voltage

VOH

Output HIGH Voltage

VOL

Output LOW Voltage

VCC = Min., IOH = –2.0 mA

VCC = Min., IOH = –4.0 mA

VCC = Min., IOL = 8 mA

(6 mA Mil)

2.4

2.4

0.4

VOL

Output LOW Voltage

VCC = Min., IOL = 16 mA

0.4

VIH

Input HIGH Level

2.0

2.0

VIL

Input LOW Level

0.8

0.8

IIX

Input Current

GND < VIN < VCC

–10 +10

–10

+10

VCD

Input Diode Clamp Voltage

Note 4

Note 4

IOZ

Output Leakage Current

GND <VOUT < VCC Com’l –10

+10

–10

+10

Output Disabled

Mil

–40 +40

–40

+40

IOS

Output Short Circuit Current[5]

VCC = Max., VOUT = GND

–20 –90

–20

–90

ICC

Power Supply Current

VCC = Max.,

Com’l

120

100

f = Max.

Mil

140

120

IOUT= 0 mA

ISB

Standby Supply Current (7C261) VCC = Max.,

Com’l

40

30

CS > VIH

Mil

40

30

VPP

Programming Supply Voltage

12

13

12

13

IPP

Programming Supply Current

50

50

VIHP

Input HIGH Programming Voltage

4.75

4.75

VILP

Input LOW Programming Voltage

0.4

0.4

Notes:

3. See the last page of this specification for Group A subgroup testing information.

4. See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing.

5. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.]

Unit

V

V

V

V

V

V

µA

µA

µA

mA

mA

mA

V

mA

V

V

Capacitance[4]

Parameter

CIN

COUT

Description

Input Capacitance

Output Capacitance

Test Conditions

TA = 25°C, f = 1 MHz,

VCC = 5.0V

Max.

Unit

10

pF

10

pF

Document #: 38-04010 Rev. **

Page 3 of 16

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