DS1701K 查看數據表（PDF） - Dallas Semiconductor -> Maxim Integrated

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DS1701K

1-Wire Thermal Device Evaluation Kit

Dallas Semiconductor -> Maxim Integrated 

DS1701K

for easy import into a spreadsheet. The most recent 50 samples are displayed in the window for

observation. Warning—the Log Data function overwrites previous file information. Data previously

stored in the file will be lost unless you change the filename. The sampling interval can be set from 1

second to 15 minutes and can be adjusted from the Sampling Interval menu at the bottom of the window.

MEMORY TAB

The Memory tab allows the user to see all 9 bytes that are read from the DS18B20, DS18S20, and

DS1822. The user also can modify and write the 2 user bytes (TH and TL) and the configuration register.

By left-clicking on the Write button, the scratchpad will be modified with new data, but the EEPROM

values are not updated until the Copy button is pressed. The user can change the TH and TL registers in

one of three formats: in hexadecimal form, in degrees C, or in degrees F. The program will detect which

text box was the last one updated, and write that value to the device.

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