HA17901 查看數據表（PDF） - Hitachi -> Renesas Electronics
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HA17901 Datasheet PDF : 16 Pages
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HA17901, HA17339 Series
Test Circuits
1. Input offset voltage (VIO), input offset current (IIO), and Input bias current (IIB) test circuit
Rf 5k
RS 50
RS 50
VC1
SW1
R 20 k
R 20 k
SW2
Rf 5 k
VC2
VCC
– RL 51k
VO
+
470µ–+ V
SW1
On
Off
On
Off
SW2
On
Off
Off
On
Vout
VO1
VO2
VO3
VO4
VC1 =
1
2
VCC
VC2 = 1.4V
VIO
=
1
| VO1
+ Rf /
|
RS
(mV)
IIO =
| VO2 – VO1 |
R(1 + Rf / RS)
(nA)
IIB =
| VO4 – VO3 |
2 · R(1 + Rf / RS)
(nA)
2. Output saturation voltage (VO sat) output sink current (Iosink), and common-mode input voltage (VCM)
test circuit
50
SW1 1
2
VC1 5k
SW2
1
2
50
VC2
VCC
1.6k
−
+
50
4.87k
Item VC1
VOsat 2V
VC3
SW3
Iosink 2V
VCM 2V
VC2 VC3 SW1
0V — 1
0V 1.5V 1
–1 to — 2
VCC
SW2 SW3
Unit
1
1 at
V
VCC = 5V
3 at
VCC = 15V
1
2
mA
Switched 3
V
between
1 and 2
3. Supply current (ICC) test circuit
1V
A
+
–
VCC
ICC: RL = ∞
6
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