HCF40101M013TR(2002) 查看數據表（PDF） - STMicroelectronics

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HCF40101M013TR
(Rev.:2002)

9 BIT PARITY GENERATOR CHECKER

STMicroelectronics 

HCF40101B

DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns)

Symbol

Parameter

VDD (V)

tPLH tPHL Propagation Delay Time

5

10

15

tPLH tPHL Propagation Delay Time

5

(INHIBIT to OUTPUT)

10

15

tTLH tTHL Transition Time

5

10

15

(*) Typical temperature coefficient for all VDD value is 0.3 %/°C.

Test Condition

Value (*)

Unit

Min. Typ. Max.

350 700

150 300 ns

100 200

140 280

70 140 ns

50 100

100 200

50 100 ns

40 80

TEST CIRCUIT

CL = 50pF or equivalent (includes jig and probe capacitance)

RL = 200KΩ

RT = ZOUT of pulse generator (typically 50Ω)

5/9

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