HCF40104(2002) 查看數據表（PDF） - STMicroelectronics

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HCF40104
(Rev.:2002)

4-BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTER

STMicroelectronics 

TEST CIRCUIT

HCF40104B

tPLH, tPHL

tPZL, tPLZ

tPZH, tPHZ

TEST

CL = 50pF or equivalent (includes jig and probe capacitance)

RL = 200KΩ

RT = ZOUT of pulse generator (typically 50Ω)

SWITCH

Open

VDD

VSS

WAVEFORM 1 : CK TO Q PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)

7/10

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