HCPL-2601W 查看數據表（PDF） - Fairchild Semiconductor
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HCPL-2601W Datasheet PDF : 12 Pages
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Transfer Characteristics (TA = -40 to +85°C Unless otherwise specified)
DC Characteristics
Test Conditions Symbol Min Typ**
High Level Output Current
(VCC = 5.5 V, VO = 5.5 V)
IOH
(IF = 250 µA, VE = 2.0 V) (Note 2)
Low Level Output Current
(VCC = 5.5 V, IF = 5 mA)
VOL
.35
(VE = 2.0 V, ICL = 13 mA) (Note 2)
Input Threshold Current
(VCC = 5.5 V, VO = 0.6 V,
IFT
3
VE = 2.0 V, IOL = 13 mA)
Max
100
0.6
5
Unit
µA
V
mA
Isolation Characteristics (TA = -40°C to +85°C Unless otherwise specified.)
Characteristics
Test Conditions Symbol Min Typ**
Input-Output
Insulation Leakage
Current
(Relative humidity = 45%)
II-O
(TA = 25°C, t = 5 s)
(VI-O = 3000 VDC)
(Note 12)
Withstand Insulation Test Voltage
Resistance (Input to Output)
Capacitance (Input to Output)
(RH < 50%, TA = 25°C)
(Note 12) ( t = 1 min.)
(VI-O = 500 V) (Note 12)
(f = 1 MHz) (Note 12)
VISO
RI-O
CI-O
2500
1012
0.6
** All Typicals at VCC = 5V, TA = 25°C
Max
1.0*
Unit
µA
VRMS
Ω
pF
NOTES
1. The VCC supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic or solid
tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and
GND pins of each device.
2. Each channel.
3. Enable Input - No pull up resistor required as the device has an internal pull up resistor.
4. tPLH -Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current pulse to the 1.5 V
level on the LOW to HIGH transition of the output voltage pulse.
5. tPHL -Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current pulse to the 1.5 V
level on the HIGH to LOW transition of the output voltage pulse.
6. tr -Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse.
7. tf -Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse.
8. tELH -Enable input propagation delay is measured from the 1.5 V level on the HIGH to LOW transition of the input voltage pulse to
the 1.5 V level on the LOW to HIGH transition of the output voltage pulse.
9. tEHL -Enable input propagation delay is measured from the 1.5 V level on the LOW to HIGH transition of the input voltage pulse to
the 1.5 V level on the HIGH to LOW transition of the output voltage pulse.
10. CMH -The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state (i.e., VOUT
> 2.0 V). Measured in volts per microsecond (V/µs).
11. CML -The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the low output state (i.e.,
VOUT < 0.8 V). Measured in volts per microsecond (V/µs).
12. Device considered a two-terminal device: Pins 1,2,3 and 4 shorted together, and Pins 5,6,7 and 8 shorted together.
4
Single-channel: 6N137, HCPL-2601, HCPL-2611 Dual-Channel: HCPL-2630, HCPL-2631 Rev. 1.0.3
www.fairchildsemi.com
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