HS-1840RH/883S 查看數據表（PDF） - Intersil
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HS-1840RH/883S
Intersil
HS-1840RH/883S Datasheet PDF : 11 Pages
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Burn-In/Life Test Circuits
HS-1840RH/883S
+VS
GND
F4
1
2
R3
4
5
6
7
8
9
10
11
12
13
14
R
28
27
-VS
26
R
25
24
23
22
21
20
19
18
F5
17
F1
16
F2
15
F3
+VS
GND
VR
1
2
R3
4
5
6
7
8
9
10
11
12
13
14
R
R
28
27
-VS
26
R
25
24
23
22
21
20
19
18
17
16
15
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
NOTES:
VS+ = +15.5V ± 0.5V, VS- = -15.5V ± 0.5V
R = 1kΩ ± 5%
C1 = C2 = 0.01µF ± 10%, 1 each per socket, minimum
D1 = D2 = 1N4002, 1 each per board, minimum
Input Signals: square wave, 50% duty cycle, 0V to 15V peak ± 10%
F1 = 100kHz; F2 = F1/2; F3 = F1/4; F4 = F1/8; F5 = F1/16
STATIC BURN-IN TEST CIRCUIT
NOTES:
R = 1kΩ ± 5%, 1/4W
C1 = C2 = 0.01µF minimum, 1 each per socket, minimum
VS+ = 15.5V ± 0.5V, VS- = -15.5V ± 0.5V, VR = 15.5 ± 0.5V
NOTES:
1. The Above Test Circuits are Utilized for All Package Types
2. The Dynamic Test Circuit is Utilized for All Life Testing
Irradiation Circuit
28 PIN DIP
+15V
1
NC
2
NC
3
+1V
4
5
6
7
8
9
10
11
12
13
14
+5V
28
27
-15V
1KΩ
26
25
24
23
22
21
20
19
18
17
16
15
NOTE: All irradiation testing is performed in the 28 pin DIP package
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