HSD4M64B4 查看數據表（PDF） - Hanbit Electronics Co.,Ltd
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HSD4M64B4
Hanbit Electronics Co.,Ltd
HSD4M64B4 Datasheet PDF : 11 Pages
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HANBit
HSD4M64B4
PIN FUNCTION DESCRIPTION
Pin
Name
Input Function
CLK
System clock
Active on the positive going edge to sample all inputs.
Disables or enables device operation by masking or enabling all inputs except
/CE
Chip enable
CLK, CKE and DQM
Masks system clock to freeze operation from the next clock cycle.
CKE
Clock enable
CKE should be enabled at least one cycle prior to new command.
Disable input buffers for power down in standby.
CKE should be enabled 1CLK+tSS prior to valid command.
A0 ~ A11
Address
Row/column addresses are multiplexed on the same pins.
Row address : RA0 ~ RA11, Column address : CA0 ~ CA7
BA0 ~ BA1
Selects bank to be activated during row address latch time.
Bank select address
Selects bank for read/write during column address latch time.
/RAS
Latches row addresses on the positive going edge of the CLK with RAS low.
Row address strobe
Enables row access & precharge.
/CAS
Column address
strobe
Latches column addresses on the positive going edge of the CLK with CAS low.
Enables column access.
Enables write operation and row precharge.
/WE
Write enable
Latches data in starting from CAS, WE active.
DQM0 ~ 7
Data input/output
mask
Makes data output Hi-Z, tSHZ after the clock and masks the output.
Blocks data input when DQM active. (Byte masking)
DQ0 ~ 63
Data input/output Data inputs/outputs are multiplexed on the same pins.
VDD/VSS
Power
supply/ground
Power and ground for the input buffers and the core logic.
ABSOLUTE MAXIMUM RATINGS
PARAMETER
SYMBOL
RATING
Voltage on Any Pin Relative to Vss
Voltage on Vcc Supply Relative to Vss
VIN ,OUT
Vcc
-1V to 4.6V
-1V to 4.6V
Power Dissipation
Storage Temperature
PD
TSTG
4W
-55oC to 150oC
Short Circuit Output Current
IOS
200mA
Notes:
Permanent device damage may occur if " Absolute Maximum Ratings" are exceeded. Functional operation should be
restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
URL:www.hbe.co.kr
REV.1.0(August.2002)
-4-
HANBit Electronics Co.,Ltd.
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