IDT7006S17PF 查看數據表（PDF） - Integrated Device Technology

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IDT7006S17PF

HIGH-SPEED 16K x 8 DUAL-PORT STATIC RAM

Integrated Device Technology 

IDT7006S/L

HIGH-SPEED 16K x 8 DUAL-PORT STATIC RAM

AC TEST CONDITIONS

Input Pulse Levels

Input Rise/Fall Times

Input Timing Reference Levels

Output Reference Levels

Output Load

GND to 3.0V

5ns Max.

1.5V

1.5V

Figures 1 and 2

2739 tbl 12

MILITARY AND COMMERCIAL TEMPERATURE RANGES

DATAOUT

BUSY

INT

775Ω

5V

1250Ω

30pF

DATAOUT

775Ω

5V

1250Ω

5pF

Figure 1. AC Output Test Load

2739 drw 06

Figure 2. Output Load

(5pF for tLZ, tHZ, tWZ, tOW)

Including scope and jig.

AC ELECTRICAL CHARACTERISTICS OVER THE

OPERATING TEMPERATURE AND SUPPLY VOLTAGE RANGE(4)

Symbol

Parameter

IDT7006X15

Com'l. Only

Min. Max.

IDT7006X17

Com'l. Only

Min. Max.

READ CYCLE

tRC

Read Cycle Time

15 —

17

—

tAA

Address Access Time

tACE

Chip Enable Access Time(3)

— 15

—

17

— 15

—

17

tAOE

Output Enable Access Time

— 10

—

10

tOH

Output Hold from Address Change

3

3

—

tLZ

Output Low-Z Time(1, 2)

3—

3

—

tHZ

Output High-Z Time(1, 2)

10

—

10

tPU

Chip Enable to Power Up Time(2)

0

0

—

tPD

Chip Disable to Power Down Time(2)

15

—

17

tSOP

Semaphore Flag Update Pulse (OE or SEM) 10

10

—

tSAA

Semaphore Address Access Time

15

—

17

IDT7006X20

Min. Max.

20

—

—

20

—

20

—

12

3

—

3

—

—

12

0

—

—

20

10

—

—

20

IDT7006X35 IDT7006X55

Symbol

Parameter

READ CYCLE

tRC

Read Cycle Time

tAA

Address Access Time

tACE

Chip Enable Access Time(3)

tAOE

Output Enable Access Time

tOH

Output Hold from Address Change

tLZ

Output Low-Z Time(1, 2)

tHZ

Output High-Z Time(1, 2)

tPU

Chip Enable to Power Up Time(2)

tPD

Chip Disable to Power Down Time(2)

tSOP

Semaphore Flag Update Pulse (OE or SEM)

tSAA

Semaphore Address Access Time

Min. Max. Min.

35

—

55

—

35

—

—

35

—

—

20

—

3

—

3

3

—

3

—

15

—

0

—

0

—

35

—

15

—

15

—

35

—

NOTES:

1. Transition is measured ±500mV from Low or High-impedance voltage with Output Test Load (Figure 2).

2. This parameter is guaranteed by device characterization, but is not production tested.

3. To access RAM, CE = VIL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL.

4. "X" in part numbers indicates power rating (S or L).

Max.

—

55

55

30

—

—

25

—

50

—

55

IDT7006X25

Min. Max. Unit

25

— ns

—

25 ns

—

25 ns

—

13 ns

3

— ns

3

— ns

—

15 ns

0

— ns

—

25 ns

10

— ns

—

25 ns

IDT7006X70

Mil. Only

Min. Max. Unit

70

— ns

—

70 ns

—

70 ns

—

35 ns

3

— ns

3

— ns

—

30 ns

0

— ns

—

50 ns

15

— ns

—

70 ns

2739 tbl 13

6.07

7

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