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IDT7006S17J 查看數據表(PDF) - Integrated Device Technology

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IDT7006S17J
IDT
Integrated Device Technology IDT
IDT7006S17J Datasheet PDF : 20 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
IDT7006S/L
HIGH-SPEED 16K x 8 DUAL-PORT STATIC RAM
WAVEFORM OF READ CYCLES(5)
ADDRESS
CE
OE
tAA (4)
tACE (4)
tAOE (4)
R/W
DATAOUT
tLZ (1)
BUSYOUT
MILITARY AND COMMERCIAL TEMPERATURE RANGES
tRC
tBDD (3, 4)
VALID DATA (4)
tOH
tHZ (2)
2739 drw 07
NOTES:
1. Timing depends on which signal is asserted last, OE or CE.
2. Timing depends on which signal is de-asserted first, CE or OE.
3. tBDD delay is required only in cases where the opposite port is completing a write operation to the same address location. For simultaneous read operations
BUSY has no relation to valid output data.
4. Start of valid data depends on which timing becomes effective last tAOE, tACE, tAA or tBDD.
5. SEM = VIH.
TIMING OF POWER-UP POWER-DOWN
CE
tPU
ICC
50%
ISB
tPD
50%
2739 drw 08
6.07
8

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