ISL97673IRZ-TK 查看數據表（PDF） - Intersil
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ISL97673IRZ-TK Datasheet PDF : 27 Pages
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ISL97673
Electrical Specifications
All specifications below are tested at TA = +25°C; VIN = 12V, EN/PWM = 5V, RSET = 20.1kΩ,
unless otherwise noted. Boldface limits apply over the operating temperature range,
-40°C to +85°C. (Continued)
PARAMETER
DESCRIPTION
CONDITION
MIN
MAX
(Note 8) TYP (Note 8) UNIT
FPWM
PWM Dimming Frequency Range
RFPWM = 660kΩ
90
100
110
Hz
tDIRECTPWM Direct PWM Minimum On Time
Direct PWM Mode
250
350
ns
FAULT PIN
IFAULT
Fault Pull-down Current
VFAULT
Fault Clamp Voltage with Respect to VIN
LXStart_thres Lx Start-up Threshold
VIN = 12V
VIN = 12V, VIN - VFAULT
12
21
30
µA
6
7
8.3
V
1.3
1.4
1.5
V
IlxStart-up Lx Start-up Current
SMBus/I2C INTERFACE LOGIC LEVEL
1
3.5
5
mA
VIL
Guaranteed Range for Data, Clock Input Low
Voltage
0.8
V
VIH
Guaranteed Range for Data, Clock Input High
1.5
Voltage
VOL
SMBus/I2C Output Data Line Logic Low Voltage IPULLUP = 4mA
ILEAK
Input Leakage On SMBData/SMBClk
SMBus/I2C TIMING SPECIFICATIONS (Note 10)
Measured at 4.8V
-10
tEN-SMB/I2C Minimum Time Between EN high and SMBus/I2C 1µF capacitor on VDC
2
Enabled
VDD
V
0.17
V
10
µA
ms
PWS
Pulse Width Suppression on SMBCLK/SMBDAT
0.15
0.45
µs
fSMB
tBUF
tHD:STA
SMBus Clock Frequency
Bus Free Time Between Stop and Start Condition
Hold Time After (Repeated) START Condition.
After this Period, the First Clock is Generated
400
kHz
1.3
µs
0.6
µs
tSU:STA
Repeated Start Condition Setup Time
0.6
µs
tSU:STO
Stop Condition Setup Time
0.6
µs
tHD:DAT
Data Hold Time
300
ns
tSU:DAT
Data Setup Time
100
ns
tLOW
Clock Low Period
1.3
µs
tHIGH
Clock High Period
0.6
µs
tF
Clock/data Fall Time
300
ns
tR
Clock/data Rise Time
300
ns
NOTES:
8. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established
by characterization and are not production tested.
9. Independent from the numbers of LEDs, at minimum VIN of 4.5V, maximum VOUT is limited to 35V. And at maximum VIN of 26.5V,
minimum VOUT is limited 28V.
10. Limits established by characterization and are not production tested.
7
FN7633.0
June 24, 2010
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