K6T1008C2E-RB70 查看數據表（PDF） - Samsung

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K6T1008C2E-RB70

128Kx8 bit Low Power CMOS Static RAM

Samsung 

K6T1008C2E Family

CMOS SRAM

PRODUCT LIST

Commercial Temperature Products(0~70°C)

Part Name

Function

K6T1008C2E-DL55

K6T1008C2E-DL70

K6T1008C2E-DB55

K6T1008C2E-DB70

32-DIP, 55ns, Low Power

32-DIP, 70ns, Low Power

32-DIP, 55ns, Low Low Power

32-DIP, 70ns, Low Low Power

Industrial Temperature Products(-40~85°C)

Part Name

Function

K6T1008C2E-GP55

K6T1008C2E-GP70

K6T1008C2E-GF55

K6T1008C2E-GF70

32-SOP, 55ns, Low Power

32-SOP, 70ns, Low Power

32-SOP, 55ns, Low Low Power

32-SOP, 70ns, Low Low Power

K6T1008C2E-GL55

K6T1008C2E-GL70

K6T1008C2E-GB55

K6T1008C2E-GB70

32-SOP, 55ns, Low Power

32-SOP, 70ns, Low Power

32-SOP, 55ns, Low Low Power

32-SOP, 70ns, Low Low Power

K6T1008C2E-TF55

K6T1008C2E-TF70

K6T1008C2E-RF55

K6T1008C2E-RF70

32-TSOP F, 55ns, Low Low Power

32-TSOP F, 70ns, Low Low Power

32-TSOP R, 55ns, Low Low Power

32-TSOP R, 70ns, Low Low Power

K6T1008C2E-TB55

K6T1008C2E-TB70

K6T1008C2E-RB55

K6T1008C2E-RB70

32-TSOP F, 55ns, Low Low Power

32-TSOP F, 70ns, Low Low Power

32-TSOP R, 55ns, Low Low Power

32-TSOP R, 70ns, Low Low Power

FUNCTIONAL DESCRIPTION

CS1

CS2

OE

WE

H

X1)

X1)

X1)

X1)

L

X1)

X1)

L

H

H

H

L

H

L

H

L

H

X1)

L

1. X means don′t care (Must be in high or low states)

I/O

High-Z

High-Z

High-Z

Dout

Din

Mode

Deselected

Deselected

Output Disabled

Read

Write

Power

Standby

Standby

Active

Active

Active

ABSOLUTE MAXIMUM RATINGS1)

Item

Symbol

Ratings

Unit

Remark

Voltage on any pin relative to Vss

VIN,VOUT

-0.5 to 7.0

V

-

Voltage on Vcc supply relative to Vss

VCC

-0.5 to 7.0

V

-

Power Dissipation

PD

1.0

W

-

Storage temperature

TSTG

-65 to 150

°C

-

Operating Temperature

TA

0 to 70

°C

-40 to 85

°C

K6T1008C2E-L/-B

K6T1008C2E-P/-F

1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be

restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.

3

Revision 3.0

March 2000

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