K6X4008T1F 查看數據表（PDF） - Samsung
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K6X4008T1F Datasheet PDF : 9 Pages
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K6X4008T1F Family
CMOS SRAM
PRODUCT LIST
Commercial Products(0~70°C)
Industrial Products(-40~85°C)
Automotive Products(-40~125°C)
Part Name
Function
Part Name
Function
Part Name
Function
K6X4008T1F-GB551)
K6X4008T1F-GB70
K6X4008T1F-GB85
K6X4008T1F-YB551)
K6X4008T1F-YB70
K6X4008T1F-YB85
K6X4008T1F-VB551)
K6X4008T1F-VB70
K6X4008T1F-VB85
K6X4008T1F-MB551)
K6X4008T1F-MB70
K6X4008T1F-MB85
32-SOP, 55ns, LL
32-SOP, 70ns, LL
32-SOP, 85ns, LL
32-sTSOP1-F, 55ns, LL
32-sTSOP1-F, 70ns, LL
32-sTSOP1-F, 85ns, LL
32-TSOP2-F, 55ns, LL
32-TSOP2-F, 70ns, LL
32-TSOP2-F, 85ns, LL
32-TSOP2-R, 55ns, LL
32-TSOP2-R, 70ns, LL
32-TSOP2-R, 85ns, LL
K6X4008T1F-GF551)
K6X4008T1F-GF70
K6X4008T1F-GF85
K6X4008T1F-YF551)
K6X4008T1F-YF70
K6X4008T1F-YF85
K6X4008T1F-VF551)
K6X4008T1F-VF70
K6X4008T1F-VF85
K6X4008T1F-MF551)
K6X4008T1F-MF70
K6X4008T1F-MF85
32-SOP, 55ns, LL
32-SOP, 70ns, LL
32-SOP, 85ns, LL
32-sTSOP1-F, 55ns, LL
32-sTSOP1-F, 70ns, LL
32-sTSOP1-F, 85ns, LL
32-TSOP2-F, 55ns, LL
32-TSOP2-F, 70ns, LL
32-TSOP2-F, 85ns, LL
32-TSOP2-R, 55ns, LL
32-TSOP2-R, 70ns, LL
32-TSOP2-R, 85ns, LL
K6X4008T1F-GQ70
K6X4008T1F-GQ85
K6X4008T1F-YQ70
K6X4008T1F-YQ85
K6X4008T1F-VQ70
K6X4008T1F-VQ85
32-SOP, 70ns, L
32-SOP, 85ns, L
32-sTSOP1-F, 70ns, L
32-sTSOP1-F, 85ns, L
32-TSOP2-F, 70ns, L
32-TSOP2-F, 85ns, L
1. Operating voltage range is 3.0V~3.6V
FUNCTIONAL DESCRIPTION
CS
OE
WE
H
X1)
X1)
L
H
H
L
L
H
L
X1)
L
1. X means don′t care (Must be in low or high state)
I/O
High-Z
High-Z
Dout
Din
Mode
Deselected
Output Disabled
Read
Write
Power
Standby
Active
Active
Active
ABSOLUTE MAXIMUM RATINGS1)
Item
Symbol
Ratings
Unit
Remark
Voltage on any pin relative to Vss
VIN, VOUT
-0.2 to VCC+0.3(max. 3.9V)
V
-
Voltage on Vcc supply relative to Vss
VCC
-0.2 to 3.9
V
-
Power Dissipation
PD
1.0
W
-
Storage temperature
TSTG
-65 to 150
°C
-
0 to 70
°C
K6F4008T1F-B
Operating Temperature
TA
-40 to 85
°C
K6F4008T1F-F
-40 to 125
°C
K6F4008T1F-Q
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be
restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
3
Revision 1.0
September 2003
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